Our Quantum and Nanotechnologies Research Centre's Developmental and Analytical Microscopy team is steered by an innovative and seasoned group of scientists who specialize in electron, ion, and scanning probe microscopy. A unique feature of our team includes their outstanding ability to design, build and modify microscopes to meet changing scientific and technological challenges.
Projects
Principal areas of expertise
- Advanced electron energy loss spectroscopy (EELS)
- Conception, development and application of nanopiezo motion instruments and systems
- Data and image acquisition and processing
- Development of hole-free phase plate electron microscopy and cryogenic capabilities for biological materials and soft material analysis
- Electrical system design
- Electron and ion nanotip sources
- Electron crystallography
- Environmental transmission electron microscope (TEM) and in-situ TEM and cryo focussed ion beams (FIB) for biological materials and soft material analysis
- Field ion microscopy
- Instrument design
- Quantitative electron tomography
- Low temperature scanning tunneling microscopy / atomic force microscopy (STM/AFM)
- Multiprobe scanning tunneling microscopy
- Microscopy system integration, micromachining, automation, programming and control
- Study of electron beam-induced radiation damage
Our experts
Mark Salomons
Team Lead
- Instrument design
- Nanoscale motion
- Scanning probe microscopy
Email: Mark.Salomons@nrc-cnrc.gc.ca
Telephone: 780-641-1733
Darren Homeniuk
- Automation
- Electrical system design
- Programming
Jian Chen
- Electron crystallography
- Environmental TEM
- High-resolution TEM and image simulation
Doug Vick
- Cryo FIB
- Focused ion beam microscopy
Jason Pitters
- Atom scale lithography
- Atomic quantum dots and atom scale electronics
- Ion and electron emission sources
- Scanning tunneling microscopy
Marek Malac
- Electron radiation damage
- Phase plate imaging
- Quantitative electron microscopy
- TEM, EELS, qEELS
Martin Cloutier
- Automation and control
- Data acquisition and processing
- Microscopy system integration
Jae-Young Cho
- EM and SPM characterization of soft nanomaterials
- In-situ characterization (solution, high temperature, cryo)
Kai Cui
- Cryo transmission electron microscopy
- Electron energy loss spectroscopy
- Focused ion beam microscopy
Patrick Price
- Electronic design
- Vacuum systems
- High-voltage electronics