Roles and responsibilities
On-wafer characterization of semiconductor devices using DC I-V, pulsed I-V, C-V and LCR, and RF s-parameter. RF calibrations and measurements from 1mHz to >50GHz using coax cables and waveguides.
Materials characterization of ohmic contact resistivity, sheet resistance and capacitance.
Instrument and measurement automation using LabVIEW, SCPI, GPIB, RS232, USB and LAN. Large dataset automated processing using LabVIEW and Origin.
Current research and/or projects
Semiconductor electrical and opto-electrical device and materials characterization including transistors, diodes, detectors, lasers, capacitors, inductors, transmission lines and batteries.
Involved with transistor characterization in the following materials: GaN HEMTs, InP (HEMTs, HBTs, FETs), SiGe HBTs, Printed Electronics, Organics and CNTs.