Cutting edge microscopy at the Nanotechnology Research Centre - Transcript
Here is an overview of the microscopy characterization capabilities of the Nanotechnology Research Centre at the National Research Council of Canada.
It all starts with proper sample preparation. We have several tools such as a cryo plunge freeze unit for producing samples requiring vitreous ice, like biological samples. We also have various sputtering units with multiple different target materials as well as cryogenic sputtering and transferring capabilities.
This is our ultra-high resolution scanning electron microscope, which uses rod-style holders for samples. We have built our own gas dosing system to turn it into in an environmental scanning electron microscope. It can also be operated in scanning transmission mode.
The Hitachi HF-3300 is a 300 kilovolt transmission electron microscope with a field emission source and CEOS electron energy loss spectrometer. This instrument also has our patented hole-free phase plate that we developed in-house, which can be used to increase contrast and reduce damage in samples.
The Hitachi H-9500 environmental transmission electron microscope has a gas dosing system and can be operated at relatively high sample pressures while dosing gases.
The NB-5000 is a dual beam focused ion beam and scanning electron microscope that can be used to prepare TEM lamella and to carry out nano and microfabrication on MEMS devices.
The JEOL 2200 is a 200 kilovolt transmission electron microscope, which is excellent for imaging biological samples using our patented hole-free phase plate and a cryogenic sample holder.
The Hitachi HT-7700 transmission electron microscope is an easy to use 100 kilovolt machine. It is used for general sample analysis and to train users.
Our Zeiss NVision 40 incorporates a Seiko focused ion beam column with a Zeiss Gemini scanning electron microscope. It is also used for various micro and nanofabrication techniques as well as cryogenic SEM imaging.
Our tabletop atomic force microscope suite consists of a Digital Instruments multimode AFM and a Digital Instruments 3100 AFM. They have been modified to allow high temperature and soft material analysis capabilities.
Our Omicron variable temperature scanning tunneling microscope is used for atom scale lithography at cryogenic temperatures.
Our field ion microscopes were built in-house and are used to image and measure the properties of our patented nanotips for everything from next generation ion sources to satellite propulsion capabilities.
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