Expertise in developmental and analytical microscopy

 

Our Nanotechnology Research Centre's Developmental and Analytical Microscopy team is steered by an innovative and seasoned group of scientists who specialize in electron, ion, and scanning probe microscopy. A unique feature of our team includes their outstanding ability to design, build and modify microscopes to meet changing scientific and technological challenges.

Principal areas of expertise

  • Advanced electron energy loss spectroscopy (EELS)
  • Conception, development and application of nanopiezo motion instruments and systems
  • Data and image acquisition and processing
  • Development of hole-free phase plate electron microscopy and cryogenic capabilities for biological materials and soft material analysis
  • Electrical system design
  • Electron and ion nanotip sources
  • Electron crystallography
  • Environmental transmission electron microscope (TEM) and in-situ TEM and cryo focussed ion beams (FIB) for biological materials and soft material analysis
  • Field ion microscopy
  • Instrument design
  • Quantitative electron tomography
  • Low temperature scanning tunneling microscopy / atomic force microscopy (STM/AFM)
  • Multiprobe scanning tunneling microscopy
  • Microscopy system integration, micromachining, automation, programming and control
  • Study of electron beam-induced radiation damage

Our experts

Mark Salomons

Mark Salomons

Team Lead

  • Instrument design
  • Nanoscale motion
  • Scanning probe microscopy

Email: Mark.Salomons@nrc-cnrc.gc.ca
Telephone: 780-641-1733

Darren Homeniuk

Darren Homeniuk

  • Automation
  • Electrical system design
  • Programming
Misa Hayashida

Misa Hayashida

  • 3D imaging
  • Electron tomography
  • FIB & EM
  • Image processing
Jian Chen

Jian Chen

  • Electron crystallography
  • Environmental TEM
  • High-resolution TEM and image simulation
Doug Vick

Doug Vick

  • Cryo FIB
  • Focused ion beam microscopy
Jason Pitters

Jason Pitters

  • Atom scale lithography
  • Atomic quantum dots and atom scale electronics
  • Ion and electron emission sources
  • Scanning tunneling microscopy
Marek Malac

Marek Malac

  • Electron radiation damage
  • Phase plate imaging
  • Quantitative electron microscopy
  • TEM, EELS, qEELS
Martin Cloutier

Martin Cloutier

  • Automation and control
  • Data acquisition and processing
  • Microscopy system integration
Jae-Young Cho

Jae-Young Cho

  • EM and SPM characterization of soft nanomaterials
  • In-situ characterization (solution, high temperature, cryo)
Kai Cui

Kai Cui

  • Cryo transmission electron microscopy
  • Electron energy loss spectroscopy
  • Focused ion beam microscopy
Drew Price

Drew Price

  • Electronic design
  • Vacuum systems
  • High-voltage electronics