Craig Storey

 

Roles and responsibilities

On-wafer characterization of semiconductor devices using DC I-V, pulsed I-V, C-V and LCR, and RF s-parameter.  RF calibrations and measurements from 1mHz to >50GHz using coax cables and waveguides.


Materials characterization of ohmic contact resistivity, sheet resistance and capacitance.

Instrument and measurement automation using LabVIEW, SCPI, GPIB, RS232, USB and LAN.    Large dataset automated processing using LabVIEW and Origin.

Current research and/or projects

Semiconductor electrical and opto-electrical device and materials characterization including transistors, diodes, detectors, lasers, capacitors, inductors, transmission lines and batteries.  

Involved with transistor characterization in the following materials: GaN HEMTs, InP (HEMTs, HBTs, FETs), SiGe HBTs, Printed Electronics, Organics and  CNTs.

Craig Storey

Technical Officer
Advanced Electronics and Photonics
1200 Montreal Road
Ottawa, Ontario K1A 0R6
Preferred language: English
Telephone: 613-998-5303

Expertise

Materials, Scientific equipment, Technology, Software, Microelectronics