Company name | Transcat Canada - Ottawa |
---|---|
Company address | 4043 Carling Avenue Ottawa, Ontario Canada K2K 2A4 |
Contact | Francis Kane Tel: 613-591-8140 Fax: 613-591-6318 Email:Francis.Kane@transcat.ca |
Clients served |
|
Fields of calibration | |
SCC accreditation (ISO/IEC 17025) |
|
This scope of calibration capabilities is published by the CLAS program of the National Research Council of Canada (NRC) in close co-operation with the laboratory accreditation program of the Standards Council of Canada (SCC), Canada's accreditation body for calibration and testing laboratories. The SCC accredits the capability of the named laboratory for being able to perform the listed calibrations at the given Calibration Measurement Capability (see Supplementary note C and note D) with traceability to the International System of Units (SI) or to standards acceptable to the CLAS program.
Type II Capability
Dimensional
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Micrometers: Outside, Inside, Depth | ||
0.0 to 0.05 inches | 7.5 µinch |
Comparison to gauge blocks. On-site calibration available. |
0.05 to 0.45 inches | ( 7 + 7L ) µinch (Note: L in 'inches') | |
0.45 to 1.0 inch | ( 5 + 12L ) µinch (Note: L in 'inches') | |
1.0 to 4.0 inches | ( 2 + 15L ) µinch (Note: L in 'inches') | |
4.0 to 40 inches | ( 9 + 16L ) µinch (Note: L in 'inches') | |
Anvil Flatness: | ||
0 to 1 inch diameter | 6.3 µinch | On-site calibration available. |
Calipers: Outside, Inside, Depth | ||
0.0 to 0.05 inches | 7.5 µinch |
Comparison to gauge blocks with surface plate and ring gauge. On-site calibration available. |
0.05 to 0.45 inches | ( 7 + 7L ) µinch (Note: L in 'inches') | |
0.45 to 1.0 inch | ( 5 + 12L ) µinch (Note: L in 'inches') | |
1.0 to 4.0 inches | ( 2 + 15L ) µinch (Note: L in 'inches') | |
4.0 to 40 inches | ( 9 + 16L ) µinch (Note: L in 'inches') | |
Dial Indicators: | ||
0.0 to 0.45 inches | ( 18 + 3L ) µinch (Note: L in 'inches') |
Comparison to Dial Indicator Tester. |
0.45 to 1.0 inch | ( 15 + 8L ) µinch (Note: L in 'inches') | |
1.0 to 4.0 inches | ( 9 + 14L ) µinch (Note: L in 'inches') | |
4.0 to 6 inches | ( 9 + 16L ) µinch (Note: L in 'inches') | |
Height Equipment and Measure: | ||
0.0 to 0.45 inches | ( 48 + 1L ) µinch (Note: L in 'inches') | Comparison to gauge blocks with surface plate. |
0.45 to 1.0 inch | ( 46 + 4L ) µinch (Note: L in 'inches') | |
1.0 to 4.0 inches | ( 40 + 10L ) µinch (Note: L in 'inches') | |
4.0 to 24 inches | ( 21 + 15L ) µinch (Note: L in 'inches') |
Electrical
Measured Quantity & Range or Instrument | Frequency | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|---|
Current, AC | |||
0 μA to 220 μA |
10 Hz to 20 Hz | 0.031 % + 16 nA |
Fluke 5700A-EP or an equivalent standard. Source. For the calibration of sinewave current measurement devices. On-site calibration available. |
20 Hz to 40 Hz | 0.019 % + 10 nA | ||
40 Hz to 1 kHz | 0.015 % + 8 nA | ||
1 kHz to 5 kHz | 0.030 % + 12 nA | ||
5 kHz to 10 kHz | 0.11 % + 65 nA | ||
0.22 mA to 2.2 mA |
10 Hz to 20 Hz | 0.03 % + 40 nA | |
20 Hz to 40 Hz | 0.018 % + 35 nA | ||
40 Hz to 1 kHz | 0.014 % + 35 nA | ||
1 kHz to 5 kHz | 0.021 % + 0.11 μA | ||
5 kHz to 10 kHz | 0.11 % + 0.65 μA | ||
2.2 mA to 22 mA |
10 Hz to 20 Hz | 0.039 % + 0.40 μA | |
20 Hz to 40 Hz | 0.019 % + 0.35 μA | ||
40 Hz to 1 kHz | 0.014 % + 0.35 μA | ||
1 kHz to 5 kHz | 0.021 % + 0.55 μA | ||
5 kHz to 10 kHz | 0.11 % + 5 μA | ||
22 mA to 220 mA |
10 Hz to 20 Hz | 0.033 % + 4 μA | |
20 Hz to 40 Hz | 0.018 % + 3.5 μA | ||
40 Hz to 1 kHz | 0.014 % + 2.5 μA | ||
1 kHz to 5 kHz | 0.021 % + 3.5 μA | ||
5 kHz to 10 kHz | 0.11 % + 10 μA | ||
0.22 A to 2.2 A | 20 Hz to 1 kHz | 0.027 % + 35 μA | |
1 kHz to 5 kHz | 0.046 % + 80 μA | ||
5 kHz to 10 kHz | 0.7 % + 0.16 mA | ||
2.2 A to 11 A | 40 Hz to 1 kHz | 0.048 % + 0.17 mA |
Fluke 5700A-EP and 5725A or equivalent standards. Source. For the calibration of sinewave current measurement devices. On-site calibration available. |
1 kHz to 5 kHz | 0.096 % + 0.38 mA | ||
5 kHz to 10 kHz | 0.36 % + 0.75 mA | ||
11 A to 20.5 A | 45 Hz to 100 Hz | 0.095 % + 3.9 mA | Fluke 5520A or equivalent standards. Source. For the calibration of sinewave current measurement devices. On-site calibration available. |
100 Hz to 1 kHz | 0.12 % + 3.9 mA | ||
1 kHz to 5 kHz | 2.3 % + 3.9 mA | ||
29 μA to 330 μA | 10 kHz to 30 kHz | 1.2 % + 0.31 μA | |
330 μA to 3.3 mA | 10 kHz to 30 kHz | 0.78 % + 0.47 μA | |
3.3 mA to 33 mA | 10 kHz to 30 kHz | 0.31 % + 3.1 µA | |
33 mA to 330 mA | 10 kHz to 30 kHz | 0.31 % + 0.16 mA | |
0 μA to 100 μA |
10 Hz to 20 Hz | 0.47 % + 35 nA |
Keysight 3458A or equivalent standard. Measure. For the calibration of current sources using a digital multimeter. On-site calibration available |
20 Hz to 45 Hz | 0.18 % + 35 nA | ||
45 Hz to 100 Hz | 0.072 % + 35 nA | ||
100 Hz to 5 kHz | 0.072 % + 35 nA | ||
100 μA to 1 mA |
10 Hz to 20 Hz | 0.46 % + 0.23 μA | |
20 Hz to 45 Hz | 0.18 % + 0.23 μA | ||
45 Hz to 100 Hz | 0.071 % + 0.23 μA | ||
100 Hz to 5 kHz | 0.038 % + 0.23 μA | ||
1 mA to 10 mA |
10 Hz to 20 Hz | 0.46 % + 2.3 μA | |
20 Hz to 45 Hz | 0.18 % + 2.3 μA | ||
45 Hz to 100 Hz | 0.071 % + 2.3 μA | ||
100 Hz to 5 kHz | 0.038 % + 2.3 μA | ||
10 mA to 100 mA | 10 Hz to 20 Hz | 0.46 % + 23 μA | |
20 Hz to 45 Hz | 0.18 % + 23 μA | ||
45 Hz to 100 Hz | 0.071 % + 23 μA | ||
100 Hz to 5 kHz | 0.037 % + 23 μA | ||
100 mA to 1 A | 10 Hz to 20 Hz | 0.46 % + 0.23 mA | |
20 Hz to 45 Hz | 0.19 % + 0.23 mA | ||
45 Hz to 100 Hz | 0.097 % + 0.23 mA | ||
100 Hz to 5 kHz | 0.12 % + 0.23 mA | ||
1 A to 2 A | 10 Hz to 45 Hz | 0.12 % + 4 mA |
Yokogawa WT310EH or equivalent standard. Measure. For the calibration of current sources using a digital multimeter. Onsite calibration available |
45 Hz to 66 Hz | 0.12 % + 1 mA | ||
66 Hz to 1 kHz | 0.12 % + 4 mA | ||
2 A to 5 A | 10 Hz to 45 Hz | 0.13 % + 10 mA | |
45 Hz to 66 Hz | 0.13 % + 2.5 mA | ||
66 Hz to 1 kHz | 0.13 % + 10 mA | ||
5 A to 10 A | 10 Hz to 45 Hz | 0.13 % + 20 mA | |
45 Hz to 66 Hz | 0.13 % + 5 mA | ||
66 Hz to 1 kHz | 0.13 % + 20 mA | ||
10 A to 20 A | 10 Hz to 45 Hz | 0.16 % + 40 mA | |
45 Hz to 66 Hz | 0.16 % + 10 mA | ||
66 Hz to 1 kHz | 0.18 % + 40 mA | ||
20 A to 40 A | 10 Hz to 45 Hz | 0.20 % + 80 mA | |
45 Hz to 66 Hz | 0.20 % + 20 mA | ||
66 Hz to 1 kHz | 0.23 % + 80 mA |
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Current, DC | ||
0 µA to 220 µA | 0.0041 % + 6 nA |
Fluke 5700A-EP with 5725A or equivalent standards. Source. For the calibration of DC current measuring devices. Onsite calibration available |
220 µA to 2.2 mA | 0.0036 % + 7 nA | |
2.2 mA to 22 mA | 0.0035 % + 40 nA | |
22 mA to 220 mA | 0.0048 % + 0.7 μA | |
220 mA to 2.2 A | 0.02 % + 12 μA | |
2.2 A to 11 A | 0.04 % + 0.48 mA | |
11 A to 20.5 A | 0.084 % + 0.58 mA | Fluke 5520A or equivalent standard. Source. For the calibration of DC current measuring devices. On-site calibration available. |
0 µA to 100 µA | 0.0026 % + 0.92 nA |
Keysight 3458A or equivalent standard. Measure. For the calibration of DC current generating devices. On-site calibration available. |
100 µA to 1 mA | 0.0026 % + 5.8 nA | |
1 mA to 10 mA | 0.0026 % + 58 nA | |
10 mA to 100 mA | 0.0043 % + 0.58 μA | |
100 mA to 1 A | 0.0130 % + 12 μA | |
1 A to 50 A | 0.03 % | Yokogawa 2792 with Keysight 3458A or equivalent standards. Measure. For the calibration of DC current generating devices. On-site calibration available. |
50 A to 100 A | 0.30 % | Empro HA-100-50 with Keysight 3458A or equivalent standards. Measure. For the calibration of DC current generating devices. On-site calibration available. |
100 A to 1000 A | 0.20 % | Empro LAB-1000-100 with Keysight 3458A or equivalent standards. Measure. For the calibration of DC current generating devices. On-site calibration available. |
Voltage, DC | ||
0 V to 220 mV | 0.00085 % + 0.44 μV | Fluke 5700A-EP or equivalent standard. Source. For the calibration of DC voltage measuring devices. On-site calibration available. |
220 mV to 2.2 V | 0.00051 % + 0.7 μV | |
2.2 V to 11 V | 0.00040 % + 2.5 μV | |
11 V to 22 V | 0.00040 % + 4 μV | |
22 V to 220 V | 0.00062 % + 40 μV | |
220 V to 1100 V | 0.00076 % + 0.40 mV | |
0 V to 100 mV | 0.00071 % + 0.58 μV | Keysight 3458A or equivalent standard. Measure. For the calibration of DC voltage generating devices. On-site calibration available. |
100 mV to 1 V | 0.00050 % + 0.58 μV | |
1 V to 10 V | 0.00051 % + 0.58 μV | |
10 V to 100 V | 0.00076 % + 35 μV | |
100 V to 500 V | 0.0011 % + 0.12 mV | |
500 V to 800 V | 0.0016 % + 0.12 mV | |
800 V to 1000 V | 0.0021 % + 0.12 mV | |
1 kV to 10 kV | 0.0374 % + 0.035 V | Vitrek 4700 or/with HVL-100 probe or equal standard. Measure. For the calibration of DC voltage generating devices. |
10 kV to 100 kV | 0.0625 % + 0.35 V |
Measured Quantity & Range or Instrument | Frequency | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|---|
Voltage, AC | |||
0 mV to 2.2 mV | 10 Hz to 20 Hz | 0.16 % + 4 μV |
Fluke 5700A-EP or equivalent standard. Source. For the calibration of sinewave voltage measurement devices. On-site calibration available. |
20 Hz to 40 Hz | 0.1 % + 4 μV | ||
40 Hz to 20 kHz | 0.078 % + 4 μV | ||
20 kHz to 50 kHz | 0.13 % + 4 μV | ||
50 kHz to 100 kHz | 0.17 % + 5 μV | ||
100 kHz to 300 kHz | 0.33 % + 10 μV | ||
300 kHz to 500 kHz | 0.47 % + 20 μV | ||
500 kHz to 1 MHz | 0.58 % + 20 μV | ||
2.2 mV to 22 mV | 10 Hz to 20 Hz | 0.042 % + 4 μV | |
20 Hz to 40 Hz | 0.03 % + 4 μV | ||
40 Hz to 20 kHz | 0.014 % + 4 μV | ||
20 kHz to 50 kHz | 0.03 % + 4 μV | ||
50 kHz to 100 kHz | 0.058 % + 5 μV | ||
100 kHz to 300 kHz | 0.12 % + 10 μV | ||
300 kHz to 500 kHz | 0.16 % + 20 μV | ||
500 kHz to 1 MHz | 0.27 % + 20 μV | ||
22 mV to 220 mV | 10 Hz to 20 Hz | 0.028 % + 12 μV | |
20 Hz to 40 Hz | 0.011 % + 7 μV | ||
40 Hz to 20 kHz | 0.0085 % + 7 μV | ||
20 kHz to 50 kHz | 0.021 % + 7 μV | ||
50 kHz to 100 kHz | 0.047 % + 17 μV | ||
100 kHz to 300 kHz | 0.091 % + 20 μV | ||
300 kHz to 500 kHz | 0.14 % + 25 μV | ||
500 kHz to 1 MHz | 0.28 % + 45 μV | ||
220 mV to 2.2 V | 10 Hz to 20 Hz | 0.027 % + 40 μV | |
20 Hz to 40 Hz | 0.010 % + 15 μV | ||
40 Hz to 20 kHz | 0.0048 % + 8 μV | ||
20 kHz to 50 kHz | 0.008 % + 10 μV | ||
50 kHz to 100 kHz | 0.012 % + 30 μV | ||
100 kHz to 300 kHz | 0.043 % + 80 μV | ||
300 kHz to 500 kHz | 0.01 % + 200 μV | ||
500 kHz to 1 MHz | 0.18 % + 300 μV | ||
2.2 V to 22 V | 10 Hz to 20 Hz | 0.028 % + 0.4 mV | |
20 Hz to 40 Hz | 0.010 % + 0.15 mV | ||
40 Hz to 20 kHz | 0.005 % + 50 μV | ||
20 kHz to 50 kHz | 0.0083 % + 0.1 mV | ||
50 kHz to 100 kHz | 0.012 % + 0.2 mV | ||
100 kHz to 300 kHz | 0.030 % + 0.6 mV | ||
300 kHz to 500 kHz | 0.11 % + 2 mV | ||
500 kHz to 1 MHz | 0.17 % + 3.2 mV | ||
22 V to 220 V | 10 Hz to 20 Hz | 0.028 % + 4 mV | |
20 Hz to 40 Hz | 0.01 % + 1.5 mV | ||
40 Hz to 20 kHz | 0.0057 % + 0.6 mV | ||
20 kHz to 50 kHz | 0.0093 % + 1 mV | ||
50 kHz to 100 kHz | 0.017 % + 2.5 mV | ||
100 kHz to 300 kHz | 0.091 % + 16 mV | ||
300 kHz to 500 kHz | 0.44 % + 40 mV | ||
500 kHz to 1 MHz | 0.8 % + 80 mV | ||
220 V to 1100 V | 40 Hz to 1 kHz | 0.011 % + 4 mV | Fluke 5700A-EP with Fluke 5725A or an equivalent standard. Source. For the calibration of sinewave voltage measurement devices. Onsite calibration available. |
1 kHz to 20 kHz | 0.017 % + 6 mV | ||
20 kHz to 30 kHz | 0.061 % + 11 mV | ||
220 V to 750 V | 30 kHz to 50 kHz | 0.061 % + 11 mV | |
50 kHz to 100 kHz | 0.23 % + 45 mV | ||
0 mV to 10 mV |
1 Hz to 40 Hz | 0.039 % + 3.5 μV |
Keysight 3458A or equivalent standard. Measure. For the calibration of voltage sources using a digital multimeter. On-site calibration available. |
40 Hz to 1 kHz | 0.029 % + 1.2 μV | ||
1 kHz to 20 kHz | 0.039 % + 1.2 μV | ||
20 kHz to 50 kHz | 0.15 % + 1.2 μV | ||
50 kHz to 100 kHz | 0.59 % + 1.2 μV | ||
100 kHz to 300 kHz | 4.7 % + 2.3 μV | ||
300 kHz to 1 MH | 1.5 % + 5.8 μV | ||
10 mV to 100 mV | 1 Hz to 40 Hz | 0.013 % + 4.6 μV | |
40 Hz to 1 kHz | 0.0095 % + 2.3 μV | ||
1 kHz to 20 kHz | 0.017 % + 2.3 μV | ||
20 kHz to 50 kHz | 0.037 % + 2.3 μV | ||
50 kHz to 100 kHz | 0.093 % + 2.3 μV | ||
100 kHz to 300 kHz | 0.36 % + 12 μV | ||
300 kHz to 1 MHz | 1.2 % + 12 μV | ||
1 MHz to 2 MHz | 1.9 % + 12 μV | ||
2 MHz to 4 MHz | 4.7 % + 81 μV | ||
4 MHz to 8 MHz | 4.7 % + 92 μV | ||
100 mV to 1 V | 1 Hz to 40 Hz | 0.0098 % + 46 μV | |
40 Hz to 1 kHz | 0.0094 % + 23 μV | ||
1 kHz to 20 kHz | 0.017 % + 23 μV | ||
20 kHz to 50 kHz | 0.036 % + 23 μV | ||
50 kHz to 100 kHz | 0.093 % + 23 μV | ||
100 kHz to 300 kHz | 0.35 % + 0.12 mV | ||
300 kHz to 1 MHz | 1.2 % + 0.12 mV | ||
1 MHz to 2 MHz | 1.9 % + 0.12 mV | ||
2 MHz to 4 MHz | 4.7 % + 0.81 mV | ||
4 MHz to 8 MHz | 4.7 % + 0.92 mV | ||
1V to 10 V | 1 Hz to 40 Hz | 0.0095 % + 0.46 mV | |
40 Hz to 1 kHz | 0.0095 % + 0.23 mV | ||
1 kHz to 20 kHz | 0.017 % + 0.23 mV | ||
20 kHz to 50 kHz | 0.036 % + 0.23 mV | ||
50 kHz to 100 kHz | 0.093 % + 0.23 mV | ||
100 kHz to 300 kHz | 0.35 % + 1.2 mV | ||
300 kHz to 1 MHz | 1.7 % + 1.2 mV | ||
1 MHz to 2 MHz | 1.8 % + 1.2 mV | ||
2 MHz to 4 MHz | 4.7 % + 8.1 mV | ||
4 MHz to 8 MHz | 4.7 % + 9.3 mV | ||
10 V to 100 V | 1 Hz to 40 Hz | 0.024 % + 4.6 mV | |
40 Hz to 1 kHz | 0.024 % + 2.3 mV | ||
1 kHz to 20 kHz | 0.024 % + 2.3 mV | ||
20 kHz to 50 kHz | 0.042 % + 2.3 mV | ||
50 kHz to 100 kHz | 0.14 % + 2.3 mV | ||
100 kHz to 300 kHz | 0.46 % + 12 mV | ||
300 kHz to 1 MHz | 1.7 % + 12 mV | ||
100 V to 700 V | 1 Hz to 40 Hz | 0.047 % + 46 mV | |
40 Hz to 1 kHz | 0.047 % + 23 mV | ||
1 kHz to 20 kHz | 0.071 % + 23 mV | ||
20 kHz to 50 kHz | 0.14 % + 23 mV | ||
50 kHz to 100 kHz | 0.35 % + 23 mV | ||
700 V to 10 kV | 10 Hz to 200 Hz | 0.14 % + 0.12 V | Vitrek 4700 or/with HVL-100 probe or equal standard. Measure. For the calibration of voltage sources. Onsite calibration available. |
200 Hz to 450 Hz | 0.46 % + 0.12 V | ||
10 kV to 70 kV | 30 Hz to 70 Hz | 0.14 % + 0.7 V | |
70 Hz to 200 Hz | 1.2 % + 0.7 V |
Current clamp calibration
Measured Quantity & Range or Instrument | Frequency | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|---|
Clamp-on Ammeter Toroidal Type: Effective AC current output | |||
20.5 A to 150 A | 45 Hz to 65 Hz | 0.42 % + 29 mA | Fluke 5520A with 5500A Current Coil or equivalent standard. Source using a multifunction calibrator and a 50 turn coil. For the calibration of clamp meters. On-site calibration available. |
65 Hz to 440 Hz | 1.0 % + 31 mA | ||
150 A to 500 A | 45 Hz to 65 Hz | 0.42 % + 130 mA | |
65 Hz to 440 Hz | 1.0 % + 140 mA | ||
500 A to 1025 A | 45 Hz to 65 Hz | 0.43 % + 220 mA | |
65 Hz to 440 Hz | 1.0 % + 230 mA | ||
Clamp-on Ammeter Non-Toroidal Type: Effective AC current output | |||
20.5 A to 150 A | 45 Hz to 65 Hz | 0.70 % + 290 mA | Fluke 5520A with 5500A Current Coil or equivalent standard. Source using a multifunction calibrator and a 50 turn coil. For the calibration of clamp meters. On-site calibration available. |
65 Hz to 440 Hz | 1.3 % + 290 mA | ||
150 A to 500 A | 45 Hz to 65 Hz | 0.70 % + 300 mA | |
65 Hz to 440 Hz | 1.3 % + 1.0 A | ||
500 A to 1025 A | 45 Hz to 65 Hz | 0.70 % + 350 mA | |
65 Hz to 440 Hz | 1.3 % + 1.1 A | ||
Clamp-on Ammeter Non-Toroidal Type: Effective DC current output | |||
20 A to 150 A | 0.58 % + 0.16 A | Fluke 5520A with 5500A Current Coil or equivalent standard. Source using a multifunction calibrator and a 50 turn coil. For the calibration of clamp meters. On-site calibration available. | |
150 A to 1000 A | 0.58 % + 0.58 A |
Power, DC
Measured Quantity & Range or Instrument | Frequency | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|---|
0.33 mA to 330 mA | |||
11 μW to 1.1 mW | DC | 0.024 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators |
1.1 mW to 110 mW | DC | 0.027 % | |
0.11 W to 110 W | DC | 0.024 % | |
110 W to 330 W | DC | 0.018 % | |
0.33 A to 3 A | |||
11 W to 110 mW | DC | 0.044 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators |
0.11 W to 990 W | DC | 0.053 % | |
1 W to 3 kW | DC | 0.0096 % | |
3 A to 20.5 A | |||
0.099 W to 0.99 W | DC | 0.088 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators |
0.99 W to 6.8 kW | DC | 0.07 % | |
6.8 kW to 20.5 kW | DC | 0.04 % |
Power, AC
Measured Quantity & Range or Instrument | Frequency | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|---|
3.3 mA to 9 mA | |||
0.11 mW to 3 mW | 10 Hz to 65 Hz | 0.13 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
3 mW to 9 W | 10 Hz to 65 Hz | 0.077 % | |
9 mA to 33 mA | |||
0.3 mW to 10 mW | 10 Hz to 65 Hz | 0.089 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
10 mW to 33 W | 10 Hz to 65 Hz | 0.077 % | |
33 mA to 90 mA | |||
1 mW to 30 mW | 10 Hz to 65 Hz | 0.071 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
30 mW to 90 W | 10 Hz to 65 Hz | 0.057 % | |
90 mA to 330 mA | |||
3.0 mW to 100 mW | 10 Hz to 65 Hz | 0.089 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
100 mW to 300 W | 10 Hz to 65 Hz | 0.078 % | |
0.33 A to 0.9 A | |||
11 mW to 300 mW | 10 Hz to 65 Hz | 0.071 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
300 mW to 900 W | 10 Hz to 65 Hz | 0.081 % | |
0.9 A to 2.2 A | |||
30 mW to 720 mW | 10 Hz to 65 Hz | 0.089 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
720 mW to 2 kW | 10 Hz to 65 Hz | 0.079 % | |
2.2 A to 4.5 A | |||
80 mW to 1.4 W | 10 Hz to 65 Hz | 0.088 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
1.4 W to 4.5 kW | 10 Hz to 65 Hz | 0.18 % | |
4.5 A to 20.5 A | |||
150 mW to 6.7 W | 10 Hz to 65 Hz | 0.17 % | Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note Footnote 1. |
6.7 W to 20 kW | 10 Hz to 65 Hz | 0.17 % | |
Phase | |||
0 ° to 179.99 ° | 10 Hz to 65 Hz | 0.11 ° |
Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. On-site calibration available. |
65 Hz to 500 Hz | 0.20 ° | ||
500 Hz to 1 kHz | 0.39 ° | ||
1 kHz to 5 kHz | 1.9 ° | ||
5 kHz to 10 kHz | 3.9 ° | ||
10 kHz to 30 kHz | 7.8 ° | ||
Capacitance | |||
0.19 nF to < 1.1 nF | 10 Hz to 10 kHz | 0.39 % + 7.8 pF | Fluke 5520A or equivalent standard. Source synthesized capacitance using a multiproduct calibrator. For the calibration of capacitance measuring devices. On-site calibration available. |
1.1 nF to < 3.3 nF | 10 Hz to 3 kHz | 0.39 % + 7.8 pF | |
3.3 nF to < 11 nF | 10 Hz to 1 kHz | 0.21 % + 7.8 pF | |
11 nF to < 33 nF | 10 Hz to 1 kHz | 0.21 % + 78 pF | |
33 nF to < 110 nF | 10 Hz to 1 kHz | 0.21 % + 78 pF | |
110 nF to < 330 nF | 10 Hz to 1 kHz | 0.21 % + 0.23 nF | |
0.33 µF to < 1.1 µF | 10 Hz to 600 Hz | 0.20 % + 0.78 nF | |
1.1 µF to < 3.3 µF | 10 Hz to 300 Hz | 0.20 % + 2.3 nF | |
3.3 µF to < 11 µF | 10 Hz to 150 Hz | 0.20 % + 7.8 nF | |
11 µF to < 33 µF | 10 Hz to 120 Hz | 0.32 % + 23 nF | |
33 µF to < 110 µF | 10 Hz to 80 Hz | 0.35 % + 78 nF | |
110 µF to < 330 µF | DC to 50 Hz | 0.35 % + 0.23 µF | |
0.33 mF to < 1.1 mF | DC to 20 Hz | 0.35 % + 0.78 µF | |
1.1 mF to < 3.3 mF | DC to 6 Hz | 0.35 % + 2.3 µF | |
3.3 mF to < 11 mF | DC to 2 Hz | 0.35 % + 7.8 µF | |
11 mF to < 33 mF | DC to 0.6 Hz | 0.58 % + 23 µF | |
33 mF to < 110 mF | DC to 0.2 Hz | 0.86 % + 78 µF | |
0.001 µF | 1 kHz | 0.065 % | Standard Capacitors. For the calibration of capacitance measuring devices. Onsite calibration available. |
0.01 µF | 1 kHz | 0.063 % | |
0.05 µF | 1 kHz | 0.063 % | |
0.1 µF | 1 kHz | 0.063 % | |
1 µF | 1 kHz | 0.063 % |
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Resistance | ||
10 MΩ to 100 MΩ | 0.08 % | IET HRRS-B-7-100K-5KV or equivalent standard. Source. For the calibration of resistance measurement devices On-site calibration available. |
100 MΩ to 1 GΩ | 0.24 % | |
1 GΩ to 10 GΩ | 0.41 % | |
10 GΩ to 100 GΩ | 0.84 % | |
100 GΩ to 1 TΩ | 2.50 % | |
1 mΩ, | 230 nΩ | Fixed Resistors. Source. For the calibration of resistance measurement devices Onsite calibration available. |
10 mΩ | 1.16 µΩ | |
100 mΩ | 48 µΩ | |
0 Ω to 10 Ω | 0.0018 % + 58 µΩ | Keysight 3458A with decade resistance or equivalent standards. Measure capability using a digital multimeter. On-site calibration available. |
10 Ω to 100 Ω | 0.0015 % + 0.58 mΩ | |
100 Ω to 1 kΩ | 0.0012 % + 0.58 mΩ | |
1 kΩ to 10 kΩ | 0.0012 % + 5.8 mΩ | |
10 kΩ to 100 kΩ | 0.0012 % + 58 mΩ | |
100 kΩ to 1 MΩ | 0.0019 % + 2.3 Ω | |
1 MΩ to 10 MΩ | 0.0062 % + 0.12 kΩ | |
10 MΩ to 100 MΩ | 0.059 % + 1.2 kΩ | |
100 MΩ to 1 GΩ | 0.58 % + 12 kΩ |
Electrical Calibration of Temperature Indicators and Simulators
Thermocouple simulation
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Type B: | ||
250 °C to 350 °C | 1.0 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
350 °C to 445 °C | 0.77 °C | |
445 °C to 580 °C | 0.61 °C | |
580 °C to 750 °C | 0.47 °C | |
750 °C to 1000 °C | 0.39 °C | |
1000 °C to 1820 °C | 0.31 °C | |
Type C: | ||
0 °C to 250 °C | 0.21 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
250 °C to 1000 °C | 0.17 °C | |
1000 °C to 1500 °C | 0.19 °C | |
1500 °C to 1800 °C | 0.22 °C | |
1800 °C to 2000 °C | 0.24 °C | |
2000 °C to 2250 °C | 0.30 °C | |
2250 °C to 2315 °C |
0.33 °C |
|
Type E: | ||
-270 °C to -245°C |
2.1 °C |
Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
-245 °C to -195 °C |
0.20 °C |
|
-195 °C to -155 °C |
0.11 °C |
|
-155 °C to -90 °C |
0.09 °C |
|
-90 °C to 0 °C |
0.08 °C |
|
0 °C to 15 °C |
0.08 °C |
|
15 °C to 890 °C |
0.07 °C |
|
890 °C to 1000 °C |
0.08 °C |
|
Type J: | ||
-210 °C to -180 °C | 0.13 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
-180 °C to -120 °C | 0.11 °C | |
-120 °C to -50 °C | 0.09 °C | |
-50 °C to 990 °C | 0.08 °C | |
990 °C to 1200 °C | 0.08 °C | |
Type K: | ||
-270 °C to -255 °C | 2.3 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
-255 °C to -195 °C |
0.73 °C |
|
-195 °C to -115 °C |
0.14 °C |
|
-115 °C to -55 °C |
0.10 °C |
|
-55 °C to 1000 °C |
0.08 °C |
|
1000 °C to 1372 °C |
0.09 °C |
|
Type N: | ||
-270 °C to -260 °C | 5.1 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
-260 °C to -200 °C |
1.1 °C |
|
-200 °C to -140 °C |
0.25 °C |
|
-140 °C to -70 °C |
0.16 °C |
|
-70 °C to 25 °C |
0.13 °C |
|
25 °C to 160 °C |
0.11 °C |
|
160 °C to 1300 °C |
0.10 °C |
|
Type R: | ||
-50 °C to -30 °C | 0.68 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
-30 °C to 45 °C |
0.58 °C |
|
45 °C to 160 °C |
0.42 °C |
|
160 °C to 380 °C |
0.31 °C |
|
380 °C to 775 °C |
0.28 °C |
|
775 °C to 1768 °C |
0.23 °C |
|
Type S: | ||
-50 °C to -30 °C | 0.65 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
-30 °C to 45 °C |
0.59 °C |
|
45 °C to 105 °C |
0.42 °C |
|
105 °C to 310 °C |
0.35 °C |
|
310 °C to 615 °C |
0.31 °C |
|
615 °C to 1768 °C | 0.27 °C | |
Type T: | ||
-270 °C to -255 °C | 1.8 °C | Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available. |
-255 °C to -240 °C | 0.52 °C | |
-240 °C to -210 °C | 0.32 °C | |
-210 °C to -150 °C | 0.19 °C | |
-150 °C to -40 °C | 0.13 °C | |
-40 °C to 100 °C | 0.09 °C | |
100 °C to 400 °C | 0.08 °C |
Oscilloscope
Parameters | Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|---|
Amplitude DC | |||
into 50 Ω Load | (-6.6 to 6.6) V | 0.20 % + 31 µV | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
into 1 MΩ Load | (-130 to 130) V | 0.039 % + 31 µV | |
Amplitude Square Wave | |||
into 50 Ω Load Rate: 10 Hz to 10 kHz |
1 mV (pk-pk) to 6.6 V (pk-pk) | 0.19 % + 31 µV | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
into 1 MΩ Load Rate: 10 Hz to 1 kHz |
1 mV (pk-pk) to 6.6 V (pk-pk) | 0.078 % + 31 µV | |
into 1 MΩ Load Rate: 1 kHz to 10 kHz |
1 mV (pk-pk) to 6.6 V (pk-pk) | 0.19 % + 31 µV | |
Timing - Generate | |||
50 Ω Load | 5 s | 0.30 % | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
2 s | 0.12 % | ||
1 s | 0.062 % | ||
500 ms | 0.032 % | ||
200 ms | 0.014 % | ||
100 ms | 0.0076 % | ||
50 ms | 0.0046 % | ||
20 ms to 1 ns | 0.00022 % | ||
Rise Time | |||
5.0 mV (pk-pk) to 2.5 V (pk-pk) Rate: 1kHz to 10 MHz |
250 ps (nominal) | 50 ps | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. See Note Footnote 2. |
Leveled Sine Wave | |||
into 50 Ω Load 5.0 mV (pk-pk) to 5.5 V (pk-pk) |
50 kHz | 1.8 % + 230 µV | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
50 kHz to 100 MHz | 2.8 % + 230 µV | ||
100 MHz to 300 MHz | 3.2 % + 230 µV | ||
300 MHz to 600 MHz | 4.0 % + 230 µV | ||
into 50Ω Load 5.0 mV (pk-pk) to 3.5 V (pk-pk) |
600 MHz to 1 GHz | 5.5 % + 230 µV | |
Bandwidth /Flatness | |||
into 50 Ω Load (50 kHz Reference) 5.0 mV (pk-pk) to 5.5 V (pk-pk) | 50 kHz to 100 MHz | 1.4 % + 78 µV | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
100 MHz to 300 MHz | 1.8 % + 78 µV | ||
300 MHz to 600 MHz | 3.2 % + 78 µV | ||
into 50Ω Load (50 kHz Reference) 5.0 mV (pk-pk) to 3.5 V (pk-pk) | 600 MHz to 1 GHz | 4.0 % + 78 µV | |
Input Impedance | |||
50 Ω Load | 40 Ω to 60 Ω | 0.082 % | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
1 MΩ Load | 500 kΩ to 1.5 MΩ | 0.081 % | |
Input Capacitance | |||
5.0 pF to 50 pF | 3.9 % + 0.39 pF | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. | |
Wave Generator – Amplitude Sine, Square, Triangle |
|||
50 Ω Load | 1.8 mV (pk-pk) to 2.5 V (pk-pk) | 2.3 % + 78 µV(pk-pk) | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
1 MΩ Load | 1.8 mV (pk-pk) to 55 V (pk-pk) | 2.3 % + 78 µV(pk-pk) | |
Wave Generator – Frequency Sine, Square, Triangle |
|||
10 Hz to 10 kHz | 0.0019 % + 0.012 Hz | Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. |
Time and Frequency
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Frequency | ||
10 MHz | 5.9 x 10-10 | Rubidium Oscillator or equivalent standard. Source. For the calibration of frequency measuring devices. Uncertainty values of derivatives of 10 MHz will differ due to resolution, noise, and gating errors. |
10 MHz | 2.3 x 10-9 | Keysight 53132A or equivalent standard. Measure capability. For the calibration of frequency sources. On-site calibration available. Uncertainty values of derivatives of 10 MHz will differ due to resolution, noise, and gating errors. |
Force
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Tension | ||
1 lbf to 400 lbf | 0.013 % + 0.6R Where R is the resolution of the device under test | For the calibration of force measuring instruments using NIST Class F Weights |
Compression | ||
1 lbf to 400 lbf | 0.013 % + 0.6R Where R is the resolution of the device under test | For the calibration of force measuring instruments using NIST Class F Weights |
Torque | ||
4 lbf-in to 10 lbf-in | 1.9 % | For the calibration of torque tools by comparison to a reference torque transducer. On-site calibration available. |
10 lbf-in to 30 lbf-in | 1.0 % | |
30 lbf-in to 80 lbf-ft | 0.76 % | |
80 lbf-ft to 250 lbf-ft | 0.60 % | |
250 lbf-ft to 600 lbf-ft | 0.57 % |
Mass
Balances
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Specific values | ||
30 kg | 82 mg | ASTM Class 1 weights or equal standard. See note Footnote 3. |
25 kg | 70 mg | |
20 kg | 55 mg | |
10 kg | 28 mg | |
5 kg | 12.3 mg | |
2 kg | 5.3 mg | |
1 kg | 2.6 mg | |
500 g | 1.9 mg | |
200 g | 0.53 mg | |
100 g | 280 μg | |
50 g | 135 μg | |
20 g | 94 μg | |
10 g | 67 μg | |
5 g | 55 μg | |
3 g | 55 μg | |
2 g | 55 μg | |
1 g | 55 μg | |
500 mg | 44 μg | |
200 mg | 44 μg | |
100 mg | 44 μg | |
50 mg | 44 μg | |
20 mg | 44 μg | |
10 mg | 44 μg | |
5 mg | 44 μg | |
1 mg | 44 μg | |
Other values | ||
1 lb to 400 lb | 0.012 % | NIST Class F weight or equal standard. See note Footnote 3. |
Pressure
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
0 psia to 7.5 psia | 0.00075 psia | For the calibration of pressure measuring devices using a reference pressure transducer. Pneumatic: Absolute. On-site calibration available. |
7.5 psia to 15 psia | 0.01 % | |
15 psia to 25 psia | 0.0019 psia | |
25 psia to 500 psia | 0.0065 % + 0.001 psia | |
500 psia to 1015 psia | 0.01 % | |
-30 inHg to -2.3 inHg | 0.0091 % | For the calibration of pressure measuring devices using a reference pressure transducer. Pneumatic: Gauge. On-site calibration available. |
-2.3 inHg to 0 inHg | 0.0002 inHg | |
0 in H2O to 7 in H2O | 0.0030 in H2O | |
7 in H2O to 40 in H2O | 0.0023 in H2O | |
40 in H2O to 14.5 psig | 0.0060 % | |
14.5 psig to 25 psig | 0.0017 psig | |
25 psig to 500 psig | 0.0065 % | |
500 psig to 1000 psig | 0.01 % | |
10 psig to 50 psig | 0.004 psig | For the calibration of pressure measuring devices using a reference pressure transducer. Hydraulic: Gauge. On-site calibration available. |
50 psig to 500 psig | 0.0079 % | |
500 psig to 1000 psig | 0.08 psig | |
1000 psig to 10000 psig | 0.0082 % |
Thermometry
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Digital Thermometers, thermometers, RTD, PRT and Thermistor probes | ||
-80 °C to 0 °C | 0.018 °C | Liquid Bath/Dry Block with HART 5628 Black Stack or equivalent standard. Source. For the calibration of temperature measuring equipment. Onsite calibration available. |
0.01 °C | 0.0033 °C | |
0 °C to 150 °C | 0.033 °C | |
150 °C C to 300°C | 0.042 °C | |
300 °C to 660 °C | 0.067 °C | |
Dry Blocks, Liquid Baths | ||
195 °C to 0 °C | 0.012 °C | HART 5628 Black Stack or equivalent standard. For the calibration of temperature sourcing equipment. Onsite calibration available. |
0 °C to 420 °C | 0.026 °C | |
420 °C to 660 °C | 0.037 °C | |
Thermocouples Wires and Probe – Type J, K, E, T | ||
80 °C to 0 °C | 0.22 °C | Liquid Bath/Dry Block with HART 5628 Black Stack and Ectron 1140A or equivalent standard. For the calibration of Thermocouple wires and probes. Onsite calibration available. |
0 °C to 100 °C | 0.22 °C | |
100 °C to 150 °C | 0.26 °C | |
150 °C to 300 °C | 0.41 °C | |
300 °C to 660 °C | 0.71 °C |
Humidity
Measured Quantity & Range or Instrument | Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes) |
Remarks |
---|---|---|
Relative Humidity | ||
0 °C to 15 °C 10% to 75 % RH | 0.50 % RH |
Thunder 2500 or equivalent standard. Source. For the calibration of relative humidity and temperature measuring instruments. |
0 °C to 15 °C 75 % to 95 % RH | 0.65 % RH | |
15 °C to 35 °C 10 % to 95 % RH | 0.50 % RH | |
35 °C to 70°C 10 % to 50 % RH | 0.50 % RH | |
35 °C to 70 °C 50 % to 75 % RH | 0.70% RH | |
35 °C to 70 °C 75 % to 95 % RH | 0.85% RH | |
Relative Humidity Controlled Chambers | ||
40°C to -20°C 0 % RH to 100 % RH | 1.80 % RH | Vaisala HM70/HMP77 or equivalent standard. Measure. For the calibration of humidity controlled chambers. On-site calibration available. |
-20°C to 40°C 0 % RH to 90 % RH | 1.26 % RH | |
-20°C to 40°C 0 % RH to 100 % RH | 2.03 % RH | |
40°C to 180°C 0 % RH to 100 % RH | 1.80 % RH |