CLAS Certificate Number 2016-02

Company name	Transcat Canada - Ottawa
Company address	4043 Carling Avenue Ottawa, Ontario Canada K2K 2A4
Contact	Francis Kane Tel: 613-591-8140 Fax: 613-591-6318 Email:Francis.Kane@transcat.ca
Clients served	All interested parties Some calibration services are available on-site. These services are indicated in the "Remarks" column of the following pages.
Fields of calibration	Dimensional Electrical Force Time and Frequency Mass Pressure Thermometry Humidity
SCC accreditation (ISO/IEC 17025)	Accredited Laboratory Nº 827 First issued 2016-05-20 Issue 2.1e 2020-01-20

This scope of calibration capabilities is published by the CLAS program of the National Research Council of Canada (NRC) in close co-operation with the laboratory accreditation program of the Standards Council of Canada (SCC), Canada's accreditation body for calibration and testing laboratories. The SCC accredits the capability of the named laboratory for being able to perform the listed calibrations at the given Calibration Measurement Capability (see Supplementary note C and note D) with traceability to the International System of Units (SI) or to standards acceptable to the CLAS program.

Type II Capability

Dimensional

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Micrometers: Outside, Inside, Depth
0.0 to 0.05 inches	7.5 µinch	Comparison to gauge blocks. On-site calibration available.
0.05 to 0.45 inches	( 7 + 7L ) µinch (Note: L in 'inches')
0.45 to 1.0 inch	( 5 + 12L ) µinch (Note: L in 'inches')
1.0 to 4.0 inches	( 2 + 15L ) µinch (Note: L in 'inches')
4.0 to 40 inches	( 9 + 16L ) µinch (Note: L in 'inches')
Anvil Flatness:
0 to 1 inch diameter	6.3 µinch	On-site calibration available.
Calipers: Outside, Inside, Depth
0.0 to 0.05 inches	7.5 µinch	Comparison to gauge blocks with surface plate and ring gauge. On-site calibration available.
0.05 to 0.45 inches	( 7 + 7L ) µinch (Note: L in 'inches')
0.45 to 1.0 inch	( 5 + 12L ) µinch (Note: L in 'inches')
1.0 to 4.0 inches	( 2 + 15L ) µinch (Note: L in 'inches')
4.0 to 40 inches	( 9 + 16L ) µinch (Note: L in 'inches')
Dial Indicators:
0.0 to 0.45 inches	( 18 + 3L ) µinch (Note: L in 'inches')	Comparison to Dial Indicator Tester.
0.45 to 1.0 inch	( 15 + 8L ) µinch (Note: L in 'inches')
1.0 to 4.0 inches	( 9 + 14L ) µinch (Note: L in 'inches')
4.0 to 6 inches	( 9 + 16L ) µinch (Note: L in 'inches')
Height Equipment and Measure:
0.0 to 0.45 inches	( 48 + 1L ) µinch (Note: L in 'inches')	Comparison to gauge blocks with surface plate.
0.45 to 1.0 inch	( 46 + 4L ) µinch (Note: L in 'inches')
1.0 to 4.0 inches	( 40 + 10L ) µinch (Note: L in 'inches')
4.0 to 24 inches	( 21 + 15L ) µinch (Note: L in 'inches')

Electrical

Measured Quantity & Range or Instrument	Frequency	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Current, AC
0 μA to 220 μA	10 Hz to 20 Hz	0.031 % + 16 nA	Fluke 5700A-EP or an equivalent standard. Source. For the calibration of sinewave current measurement devices. On-site calibration available.
	20 Hz to 40 Hz	0.019 % + 10 nA
	40 Hz to 1 kHz	0.015 % + 8 nA
	1 kHz to 5 kHz	0.030 % + 12 nA
	5 kHz to 10 kHz	0.11 % + 65 nA
0.22 mA to 2.2 mA	10 Hz to 20 Hz	0.03 % + 40 nA
	20 Hz to 40 Hz	0.018 % + 35 nA
	40 Hz to 1 kHz	0.014 % + 35 nA
	1 kHz to 5 kHz	0.021 % + 0.11 μA
	5 kHz to 10 kHz	0.11 % + 0.65 μA
2.2 mA to 22 mA	10 Hz to 20 Hz	0.039 % + 0.40 μA
	20 Hz to 40 Hz	0.019 % + 0.35 μA
	40 Hz to 1 kHz	0.014 % + 0.35 μA
	1 kHz to 5 kHz	0.021 % + 0.55 μA
	5 kHz to 10 kHz	0.11 % + 5 μA
22 mA to 220 mA	10 Hz to 20 Hz	0.033 % + 4 μA
	20 Hz to 40 Hz	0.018 % + 3.5 μA
	40 Hz to 1 kHz	0.014 % + 2.5 μA
	1 kHz to 5 kHz	0.021 % + 3.5 μA
	5 kHz to 10 kHz	0.11 % + 10 μA
0.22 A to 2.2 A	20 Hz to 1 kHz	0.027 % + 35 μA
	1 kHz to 5 kHz	0.046 % + 80 μA
	5 kHz to 10 kHz	0.7 % + 0.16 mA
2.2 A to 11 A	40 Hz to 1 kHz	0.048 % + 0.17 mA	Fluke 5700A-EP and 5725A or equivalent standards. Source. For the calibration of sinewave current measurement devices. On-site calibration available.
	1 kHz to 5 kHz	0.096 % + 0.38 mA
	5 kHz to 10 kHz	0.36 % + 0.75 mA
11 A to 20.5 A	45 Hz to 100 Hz	0.095 % + 3.9 mA	Fluke 5520A or equivalent standards. Source. For the calibration of sinewave current measurement devices. On-site calibration available.
	100 Hz to 1 kHz	0.12 % + 3.9 mA
	1 kHz to 5 kHz	2.3 % + 3.9 mA
29 μA to 330 μA	10 kHz to 30 kHz	1.2 % + 0.31 μA
330 μA to 3.3 mA	10 kHz to 30 kHz	0.78 % + 0.47 μA
3.3 mA to 33 mA	10 kHz to 30 kHz	0.31 % + 3.1 µA
33 mA to 330 mA	10 kHz to 30 kHz	0.31 % + 0.16 mA
0 μA to 100 μA	10 Hz to 20 Hz	0.47 % + 35 nA	Keysight 3458A or equivalent standard. Measure. For the calibration of current sources using a digital multimeter. On-site calibration available
	20 Hz to 45 Hz	0.18 % + 35 nA
	45 Hz to 100 Hz	0.072 % + 35 nA
	100 Hz to 5 kHz	0.072 % + 35 nA
100 μA to 1 mA	10 Hz to 20 Hz	0.46 % + 0.23 μA
	20 Hz to 45 Hz	0.18 % + 0.23 μA
	45 Hz to 100 Hz	0.071 % + 0.23 μA
	100 Hz to 5 kHz	0.038 % + 0.23 μA
1 mA to 10 mA	10 Hz to 20 Hz	0.46 % + 2.3 μA
	20 Hz to 45 Hz	0.18 % + 2.3 μA
	45 Hz to 100 Hz	0.071 % + 2.3 μA
	100 Hz to 5 kHz	0.038 % + 2.3 μA
10 mA to 100 mA	10 Hz to 20 Hz	0.46 % + 23 μA
	20 Hz to 45 Hz	0.18 % + 23 μA
	45 Hz to 100 Hz	0.071 % + 23 μA
	100 Hz to 5 kHz	0.037 % + 23 μA
100 mA to 1 A	10 Hz to 20 Hz	0.46 % + 0.23 mA
	20 Hz to 45 Hz	0.19 % + 0.23 mA
	45 Hz to 100 Hz	0.097 % + 0.23 mA
	100 Hz to 5 kHz	0.12 % + 0.23 mA
1 A to 2 A	10 Hz to 45 Hz	0.12 % + 4 mA	Yokogawa WT310EH or equivalent standard. Measure. For the calibration of current sources using a digital multimeter. Onsite calibration available
	45 Hz to 66 Hz	0.12 % + 1 mA
	66 Hz to 1 kHz	0.12 % + 4 mA
2 A to 5 A	10 Hz to 45 Hz	0.13 % + 10 mA
	45 Hz to 66 Hz	0.13 % + 2.5 mA
	66 Hz to 1 kHz	0.13 % + 10 mA
5 A to 10 A	10 Hz to 45 Hz	0.13 % + 20 mA
	45 Hz to 66 Hz	0.13 % + 5 mA
	66 Hz to 1 kHz	0.13 % + 20 mA
10 A to 20 A	10 Hz to 45 Hz	0.16 % + 40 mA
	45 Hz to 66 Hz	0.16 % + 10 mA
	66 Hz to 1 kHz	0.18 % + 40 mA
20 A to 40 A	10 Hz to 45 Hz	0.20 % + 80 mA
	45 Hz to 66 Hz	0.20 % + 20 mA
	66 Hz to 1 kHz	0.23 % + 80 mA

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Current, DC
0 µA to 220 µA	0.0041 % + 6 nA	Fluke 5700A-EP with 5725A or equivalent standards. Source. For the calibration of DC current measuring devices. Onsite calibration available
220 µA to 2.2 mA	0.0036 % + 7 nA
2.2 mA to 22 mA	0.0035 % + 40 nA
22 mA to 220 mA	0.0048 % + 0.7 μA
220 mA to 2.2 A	0.02 % + 12 μA
2.2 A to 11 A	0.04 % + 0.48 mA
11 A to 20.5 A	0.084 % + 0.58 mA	Fluke 5520A or equivalent standard. Source. For the calibration of DC current measuring devices. On-site calibration available.
0 µA to 100 µA	0.0026 % + 0.92 nA	Keysight 3458A or equivalent standard. Measure. For the calibration of DC current generating devices. On-site calibration available.
100 µA to 1 mA	0.0026 % + 5.8 nA
1 mA to 10 mA	0.0026 % + 58 nA
10 mA to 100 mA	0.0043 % + 0.58 μA
100 mA to 1 A	0.0130 % + 12 μA
1 A to 50 A	0.03 %	Yokogawa 2792 with Keysight 3458A or equivalent standards. Measure. For the calibration of DC current generating devices. On-site calibration available.
50 A to 100 A	0.30 %	Empro HA-100-50 with Keysight 3458A or equivalent standards. Measure. For the calibration of DC current generating devices. On-site calibration available.
100 A to 1000 A	0.20 %	Empro LAB-1000-100 with Keysight 3458A or equivalent standards. Measure. For the calibration of DC current generating devices. On-site calibration available.
Voltage, DC
0 V to 220 mV	0.00085 % + 0.44 μV	Fluke 5700A-EP or equivalent standard. Source. For the calibration of DC voltage measuring devices. On-site calibration available.
220 mV to 2.2 V	0.00051 % + 0.7 μV
2.2 V to 11 V	0.00040 % + 2.5 μV
11 V to 22 V	0.00040 % + 4 μV
22 V to 220 V	0.00062 % + 40 μV
220 V to 1100 V	0.00076 % + 0.40 mV
0 V to 100 mV	0.00071 % + 0.58 μV	Keysight 3458A or equivalent standard. Measure. For the calibration of DC voltage generating devices. On-site calibration available.
100 mV to 1 V	0.00050 % + 0.58 μV
1 V to 10 V	0.00051 % + 0.58 μV
10 V to 100 V	0.00076 % + 35 μV
100 V to 500 V	0.0011 % + 0.12 mV
500 V to 800 V	0.0016 % + 0.12 mV
800 V to 1000 V	0.0021 % + 0.12 mV
1 kV to 10 kV	0.0374 % + 0.035 V	Vitrek 4700 or/with HVL-100 probe or equal standard. Measure. For the calibration of DC voltage generating devices.
10 kV to 100 kV	0.0625 % + 0.35 V

Measured Quantity & Range or Instrument	Frequency	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Voltage, AC
0 mV to 2.2 mV	10 Hz to 20 Hz	0.16 % + 4 μV	Fluke 5700A-EP or equivalent standard. Source. For the calibration of sinewave voltage measurement devices. On-site calibration available.
	20 Hz to 40 Hz	0.1 % + 4 μV
	40 Hz to 20 kHz	0.078 % + 4 μV
	20 kHz to 50 kHz	0.13 % + 4 μV
	50 kHz to 100 kHz	0.17 % + 5 μV
	100 kHz to 300 kHz	0.33 % + 10 μV
	300 kHz to 500 kHz	0.47 % + 20 μV
	500 kHz to 1 MHz	0.58 % + 20 μV
2.2 mV to 22 mV	10 Hz to 20 Hz	0.042 % + 4 μV
	20 Hz to 40 Hz	0.03 % + 4 μV
	40 Hz to 20 kHz	0.014 % + 4 μV
	20 kHz to 50 kHz	0.03 % + 4 μV
	50 kHz to 100 kHz	0.058 % + 5 μV
	100 kHz to 300 kHz	0.12 % + 10 μV
	300 kHz to 500 kHz	0.16 % + 20 μV
	500 kHz to 1 MHz	0.27 % + 20 μV
22 mV to 220 mV	10 Hz to 20 Hz	0.028 % + 12 μV
	20 Hz to 40 Hz	0.011 % + 7 μV
	40 Hz to 20 kHz	0.0085 % + 7 μV
	20 kHz to 50 kHz	0.021 % + 7 μV
	50 kHz to 100 kHz	0.047 % + 17 μV
	100 kHz to 300 kHz	0.091 % + 20 μV
	300 kHz to 500 kHz	0.14 % + 25 μV
	500 kHz to 1 MHz	0.28 % + 45 μV
220 mV to 2.2 V	10 Hz to 20 Hz	0.027 % + 40 μV
	20 Hz to 40 Hz	0.010 % + 15 μV
	40 Hz to 20 kHz	0.0048 % + 8 μV
	20 kHz to 50 kHz	0.008 % + 10 μV
	50 kHz to 100 kHz	0.012 % + 30 μV
	100 kHz to 300 kHz	0.043 % + 80 μV
	300 kHz to 500 kHz	0.01 % + 200 μV
	500 kHz to 1 MHz	0.18 % + 300 μV
2.2 V to 22 V	10 Hz to 20 Hz	0.028 % + 0.4 mV
	20 Hz to 40 Hz	0.010 % + 0.15 mV
	40 Hz to 20 kHz	0.005 % + 50 μV
	20 kHz to 50 kHz	0.0083 % + 0.1 mV
	50 kHz to 100 kHz	0.012 % + 0.2 mV
	100 kHz to 300 kHz	0.030 % + 0.6 mV
	300 kHz to 500 kHz	0.11 % + 2 mV
	500 kHz to 1 MHz	0.17 % + 3.2 mV
22 V to 220 V	10 Hz to 20 Hz	0.028 % + 4 mV
	20 Hz to 40 Hz	0.01 % + 1.5 mV
	40 Hz to 20 kHz	0.0057 % + 0.6 mV
	20 kHz to 50 kHz	0.0093 % + 1 mV
	50 kHz to 100 kHz	0.017 % + 2.5 mV
	100 kHz to 300 kHz	0.091 % + 16 mV
	300 kHz to 500 kHz	0.44 % + 40 mV
	500 kHz to 1 MHz	0.8 % + 80 mV
220 V to 1100 V	40 Hz to 1 kHz	0.011 % + 4 mV	Fluke 5700A-EP with Fluke 5725A or an equivalent standard. Source. For the calibration of sinewave voltage measurement devices. Onsite calibration available.
	1 kHz to 20 kHz	0.017 % + 6 mV
	20 kHz to 30 kHz	0.061 % + 11 mV
220 V to 750 V	30 kHz to 50 kHz	0.061 % + 11 mV
220 V to 750 V	50 kHz to 100 kHz	0.23 % + 45 mV
0 mV to 10 mV	1 Hz to 40 Hz	0.039 % + 3.5 μV	Keysight 3458A or equivalent standard. Measure. For the calibration of voltage sources using a digital multimeter. On-site calibration available.
	40 Hz to 1 kHz	0.029 % + 1.2 μV
	1 kHz to 20 kHz	0.039 % + 1.2 μV
	20 kHz to 50 kHz	0.15 % + 1.2 μV
	50 kHz to 100 kHz	0.59 % + 1.2 μV
	100 kHz to 300 kHz	4.7 % + 2.3 μV
	300 kHz to 1 MH	1.5 % + 5.8 μV
10 mV to 100 mV	1 Hz to 40 Hz	0.013 % + 4.6 μV
	40 Hz to 1 kHz	0.0095 % + 2.3 μV
	1 kHz to 20 kHz	0.017 % + 2.3 μV
	20 kHz to 50 kHz	0.037 % + 2.3 μV
	50 kHz to 100 kHz	0.093 % + 2.3 μV
	100 kHz to 300 kHz	0.36 % + 12 μV
	300 kHz to 1 MHz	1.2 % + 12 μV
	1 MHz to 2 MHz	1.9 % + 12 μV
	2 MHz to 4 MHz	4.7 % + 81 μV
	4 MHz to 8 MHz	4.7 % + 92 μV
100 mV to 1 V	1 Hz to 40 Hz	0.0098 % + 46 μV
	40 Hz to 1 kHz	0.0094 % + 23 μV
	1 kHz to 20 kHz	0.017 % + 23 μV
	20 kHz to 50 kHz	0.036 % + 23 μV
	50 kHz to 100 kHz	0.093 % + 23 μV
	100 kHz to 300 kHz	0.35 % + 0.12 mV
	300 kHz to 1 MHz	1.2 % + 0.12 mV
	1 MHz to 2 MHz	1.9 % + 0.12 mV
	2 MHz to 4 MHz	4.7 % + 0.81 mV
	4 MHz to 8 MHz	4.7 % + 0.92 mV
1V to 10 V	1 Hz to 40 Hz	0.0095 % + 0.46 mV
	40 Hz to 1 kHz	0.0095 % + 0.23 mV
	1 kHz to 20 kHz	0.017 % + 0.23 mV
	20 kHz to 50 kHz	0.036 % + 0.23 mV
	50 kHz to 100 kHz	0.093 % + 0.23 mV
	100 kHz to 300 kHz	0.35 % + 1.2 mV
	300 kHz to 1 MHz	1.7 % + 1.2 mV
	1 MHz to 2 MHz	1.8 % + 1.2 mV
	2 MHz to 4 MHz	4.7 % + 8.1 mV
	4 MHz to 8 MHz	4.7 % + 9.3 mV
10 V to 100 V	1 Hz to 40 Hz	0.024 % + 4.6 mV
	40 Hz to 1 kHz	0.024 % + 2.3 mV
	1 kHz to 20 kHz	0.024 % + 2.3 mV
	20 kHz to 50 kHz	0.042 % + 2.3 mV
	50 kHz to 100 kHz	0.14 % + 2.3 mV
	100 kHz to 300 kHz	0.46 % + 12 mV
	300 kHz to 1 MHz	1.7 % + 12 mV
100 V to 700 V	1 Hz to 40 Hz	0.047 % + 46 mV
	40 Hz to 1 kHz	0.047 % + 23 mV
	1 kHz to 20 kHz	0.071 % + 23 mV
	20 kHz to 50 kHz	0.14 % + 23 mV
	50 kHz to 100 kHz	0.35 % + 23 mV
700 V to 10 kV	10 Hz to 200 Hz	0.14 % + 0.12 V	Vitrek 4700 or/with HVL-100 probe or equal standard. Measure. For the calibration of voltage sources. Onsite calibration available.
700 V to 10 kV	200 Hz to 450 Hz	0.46 % + 0.12 V
10 kV to 70 kV	30 Hz to 70 Hz	0.14 % + 0.7 V
10 kV to 70 kV	70 Hz to 200 Hz	1.2 % + 0.7 V

Current clamp calibration

Measured Quantity & Range or Instrument	Frequency	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Clamp-on Ammeter Toroidal Type: Effective AC current output
20.5 A to 150 A	45 Hz to 65 Hz	0.42 % + 29 mA	Fluke 5520A with 5500A Current Coil or equivalent standard. Source using a multifunction calibrator and a 50 turn coil. For the calibration of clamp meters. On-site calibration available.
20.5 A to 150 A	65 Hz to 440 Hz	1.0 % + 31 mA
150 A to 500 A	45 Hz to 65 Hz	0.42 % + 130 mA
150 A to 500 A	65 Hz to 440 Hz	1.0 % + 140 mA
500 A to 1025 A	45 Hz to 65 Hz	0.43 % + 220 mA
500 A to 1025 A	65 Hz to 440 Hz	1.0 % + 230 mA
Clamp-on Ammeter Non-Toroidal Type: Effective AC current output
20.5 A to 150 A	45 Hz to 65 Hz	0.70 % + 290 mA	Fluke 5520A with 5500A Current Coil or equivalent standard. Source using a multifunction calibrator and a 50 turn coil. For the calibration of clamp meters. On-site calibration available.
20.5 A to 150 A	65 Hz to 440 Hz	1.3 % + 290 mA
150 A to 500 A	45 Hz to 65 Hz	0.70 % + 300 mA
150 A to 500 A	65 Hz to 440 Hz	1.3 % + 1.0 A
500 A to 1025 A	45 Hz to 65 Hz	0.70 % + 350 mA
500 A to 1025 A	65 Hz to 440 Hz	1.3 % + 1.1 A
Clamp-on Ammeter Non-Toroidal Type: Effective DC current output
20 A to 150 A		0.58 % + 0.16 A	Fluke 5520A with 5500A Current Coil or equivalent standard. Source using a multifunction calibrator and a 50 turn coil. For the calibration of clamp meters. On-site calibration available.
150 A to 1000 A		0.58 % + 0.58 A

Power, DC

Measured Quantity & Range or Instrument	Frequency	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
0.33 mA to 330 mA
11 μW to 1.1 mW	DC	0.024 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators
1.1 mW to 110 mW	DC	0.027 %
0.11 W to 110 W	DC	0.024 %
110 W to 330 W	DC	0.018 %
0.33 A to 3 A
11 W to 110 mW	DC	0.044 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators
0.11 W to 990 W	DC	0.053 %
1 W to 3 kW	DC	0.0096 %
3 A to 20.5 A
0.099 W to 0.99 W	DC	0.088 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators
0.99 W to 6.8 kW	DC	0.07 %
6.8 kW to 20.5 kW	DC	0.04 %

Power, AC

Measured Quantity & Range or Instrument	Frequency	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
3.3 mA to 9 mA
0.11 mW to 3 mW	10 Hz to 65 Hz	0.13 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
3 mW to 9 W	10 Hz to 65 Hz	0.077 %
9 mA to 33 mA
0.3 mW to 10 mW	10 Hz to 65 Hz	0.089 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
10 mW to 33 W	10 Hz to 65 Hz	0.077 %
33 mA to 90 mA
1 mW to 30 mW	10 Hz to 65 Hz	0.071 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
30 mW to 90 W	10 Hz to 65 Hz	0.057 %
90 mA to 330 mA
3.0 mW to 100 mW	10 Hz to 65 Hz	0.089 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
100 mW to 300 W	10 Hz to 65 Hz	0.078 %
0.33 A to 0.9 A
11 mW to 300 mW	10 Hz to 65 Hz	0.071 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
300 mW to 900 W	10 Hz to 65 Hz	0.081 %
0.9 A to 2.2 A
30 mW to 720 mW	10 Hz to 65 Hz	0.089 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
720 mW to 2 kW	10 Hz to 65 Hz	0.079 %
2.2 A to 4.5 A
80 mW to 1.4 W	10 Hz to 65 Hz	0.088 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
1.4 W to 4.5 kW	10 Hz to 65 Hz	0.18 %
4.5 A to 20.5 A
150 mW to 6.7 W	10 Hz to 65 Hz	0.17 %	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. (PF = 1). See Note ^{Footnote 1}.
6.7 W to 20 kW	10 Hz to 65 Hz	0.17 %
Phase
0 ° to 179.99 °	10 Hz to 65 Hz	0.11 °	Fluke 5520A or equivalent standard. Source. For the calibration of measurement devices using multifunction calibrators. On-site calibration available.
	65 Hz to 500 Hz	0.20 °
	500 Hz to 1 kHz	0.39 °
	1 kHz to 5 kHz	1.9 °
	5 kHz to 10 kHz	3.9 °
	10 kHz to 30 kHz	7.8 °
Capacitance
0.19 nF to < 1.1 nF	10 Hz to 10 kHz	0.39 % + 7.8 pF	Fluke 5520A or equivalent standard. Source synthesized capacitance using a multiproduct calibrator. For the calibration of capacitance measuring devices. On-site calibration available.
1.1 nF to < 3.3 nF	10 Hz to 3 kHz	0.39 % + 7.8 pF
3.3 nF to < 11 nF	10 Hz to 1 kHz	0.21 % + 7.8 pF
11 nF to < 33 nF	10 Hz to 1 kHz	0.21 % + 78 pF
33 nF to < 110 nF	10 Hz to 1 kHz	0.21 % + 78 pF
110 nF to < 330 nF	10 Hz to 1 kHz	0.21 % + 0.23 nF
0.33 µF to < 1.1 µF	10 Hz to 600 Hz	0.20 % + 0.78 nF
1.1 µF to < 3.3 µF	10 Hz to 300 Hz	0.20 % + 2.3 nF
3.3 µF to < 11 µF	10 Hz to 150 Hz	0.20 % + 7.8 nF
11 µF to < 33 µF	10 Hz to 120 Hz	0.32 % + 23 nF
33 µF to < 110 µF	10 Hz to 80 Hz	0.35 % + 78 nF
110 µF to < 330 µF	DC to 50 Hz	0.35 % + 0.23 µF
0.33 mF to < 1.1 mF	DC to 20 Hz	0.35 % + 0.78 µF
1.1 mF to < 3.3 mF	DC to 6 Hz	0.35 % + 2.3 µF
3.3 mF to < 11 mF	DC to 2 Hz	0.35 % + 7.8 µF
11 mF to < 33 mF	DC to 0.6 Hz	0.58 % + 23 µF
33 mF to < 110 mF	DC to 0.2 Hz	0.86 % + 78 µF
0.001 µF	1 kHz	0.065 %	Standard Capacitors. For the calibration of capacitance measuring devices. Onsite calibration available.
0.01 µF	1 kHz	0.063 %
0.05 µF	1 kHz	0.063 %
0.1 µF	1 kHz	0.063 %
1 µF	1 kHz	0.063 %

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Resistance
10 MΩ to 100 MΩ	0.08 %	IET HRRS-B-7-100K-5KV or equivalent standard. Source. For the calibration of resistance measurement devices On-site calibration available.
100 MΩ to 1 GΩ	0.24 %
1 GΩ to 10 GΩ	0.41 %
10 GΩ to 100 GΩ	0.84 %
100 GΩ to 1 TΩ	2.50 %
1 mΩ,	230 nΩ	Fixed Resistors. Source. For the calibration of resistance measurement devices Onsite calibration available.
10 mΩ	1.16 µΩ
100 mΩ	48 µΩ
0 Ω to 10 Ω	0.0018 % + 58 µΩ	Keysight 3458A with decade resistance or equivalent standards. Measure capability using a digital multimeter. On-site calibration available.
10 Ω to 100 Ω	0.0015 % + 0.58 mΩ
100 Ω to 1 kΩ	0.0012 % + 0.58 mΩ
1 kΩ to 10 kΩ	0.0012 % + 5.8 mΩ
10 kΩ to 100 kΩ	0.0012 % + 58 mΩ
100 kΩ to 1 MΩ	0.0019 % + 2.3 Ω
1 MΩ to 10 MΩ	0.0062 % + 0.12 kΩ
10 MΩ to 100 MΩ	0.059 % + 1.2 kΩ
100 MΩ to 1 GΩ	0.58 % + 12 kΩ

Electrical Calibration of Temperature Indicators and Simulators

Thermocouple simulation

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Type B:
250 °C to 350 °C	1.0 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
350 °C to 445 °C	0.77 °C
445 °C to 580 °C	0.61 °C
580 °C to 750 °C	0.47 °C
750 °C to 1000 °C	0.39 °C
1000 °C to 1820 °C	0.31 °C
Type C:
0 °C to 250 °C	0.21 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
250 °C to 1000 °C	0.17 °C
1000 °C to 1500 °C	0.19 °C
1500 °C to 1800 °C	0.22 °C
1800 °C to 2000 °C	0.24 °C
2000 °C to 2250 °C	0.30 °C
2250 °C to 2315 °C	0.33 °C
Type E:
-270 °C to -245°C	2.1 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
-245 °C to -195 °C	0.20 °C
-195 °C to -155 °C	0.11 °C
-155 °C to -90 °C	0.09 °C
-90 °C to 0 °C	0.08 °C
0 °C to 15 °C	0.08 °C
15 °C to 890 °C	0.07 °C
890 °C to 1000 °C	0.08 °C
Type J:
-210 °C to -180 °C	0.13 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
-180 °C to -120 °C	0.11 °C
-120 °C to -50 °C	0.09 °C
-50 °C to 990 °C	0.08 °C
990 °C to 1200 °C	0.08 °C
Type K:
-270 °C to -255 °C	2.3 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
-255 °C to -195 °C	0.73 °C
-195 °C to -115 °C	0.14 °C
-115 °C to -55 °C	0.10 °C
-55 °C to 1000 °C	0.08 °C
1000 °C to 1372 °C	0.09 °C
Type N:
-270 °C to -260 °C	5.1 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
-260 °C to -200 °C	1.1 °C
-200 °C to -140 °C	0.25 °C
-140 °C to -70 °C	0.16 °C
-70 °C to 25 °C	0.13 °C
25 °C to 160 °C	0.11 °C
160 °C to 1300 °C	0.10 °C
Type R:
-50 °C to -30 °C	0.68 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
-30 °C to 45 °C	0.58 °C
45 °C to 160 °C	0.42 °C
160 °C to 380 °C	0.31 °C
380 °C to 775 °C	0.28 °C
775 °C to 1768 °C	0.23 °C
Type S:
-50 °C to -30 °C	0.65 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
-30 °C to 45 °C	0.59 °C
45 °C to 105 °C	0.42 °C
105 °C to 310 °C	0.35 °C
310 °C to 615 °C	0.31 °C
615 °C to 1768 °C	0.27 °C
Type T:
-270 °C to -255 °C	1.8 °C	Ectron 1140A or equivalent standard. Source and Measure. For the calibration of temperature indicators and process calibrators by electrical stimulation of temperature. Onsite calibration available.
-255 °C to -240 °C	0.52 °C
-240 °C to -210 °C	0.32 °C
-210 °C to -150 °C	0.19 °C
-150 °C to -40 °C	0.13 °C
-40 °C to 100 °C	0.09 °C
100 °C to 400 °C	0.08 °C

Oscilloscope

Parameters	Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Amplitude DC
into 50 Ω Load	(-6.6 to 6.6) V	0.20 % + 31 µV	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
into 1 MΩ Load	(-130 to 130) V	0.039 % + 31 µV
Amplitude Square Wave
into 50 Ω Load Rate: 10 Hz to 10 kHz	1 mV (pk-pk) to 6.6 V (pk-pk)	0.19 % + 31 µV	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
into 1 MΩ Load Rate: 10 Hz to 1 kHz	1 mV (pk-pk) to 6.6 V (pk-pk)	0.078 % + 31 µV
into 1 MΩ Load Rate: 1 kHz to 10 kHz	1 mV (pk-pk) to 6.6 V (pk-pk)	0.19 % + 31 µV
Timing - Generate
50 Ω Load	5 s	0.30 %	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
	2 s	0.12 %
	1 s	0.062 %
	500 ms	0.032 %
	200 ms	0.014 %
	100 ms	0.0076 %
	50 ms	0.0046 %
	20 ms to 1 ns	0.00022 %
Rise Time
5.0 mV (pk-pk) to 2.5 V (pk-pk) Rate: 1kHz to 10 MHz	250 ps (nominal)	50 ps	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available. See Note ^{Footnote 2}.
Leveled Sine Wave
into 50 Ω Load 5.0 mV (pk-pk) to 5.5 V (pk-pk)	50 kHz	1.8 % + 230 µV	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
	50 kHz to 100 MHz	2.8 % + 230 µV
	100 MHz to 300 MHz	3.2 % + 230 µV
	300 MHz to 600 MHz	4.0 % + 230 µV
into 50Ω Load 5.0 mV (pk-pk) to 3.5 V (pk-pk)	600 MHz to 1 GHz	5.5 % + 230 µV
Bandwidth /Flatness
into 50 Ω Load (50 kHz Reference) 5.0 mV (pk-pk) to 5.5 V (pk-pk)	50 kHz to 100 MHz	1.4 % + 78 µV	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
	100 MHz to 300 MHz	1.8 % + 78 µV
	300 MHz to 600 MHz	3.2 % + 78 µV
into 50Ω Load (50 kHz Reference) 5.0 mV (pk-pk) to 3.5 V (pk-pk)	600 MHz to 1 GHz	4.0 % + 78 µV
Input Impedance
50 Ω Load	40 Ω to 60 Ω	0.082 %	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
1 MΩ Load	500 kΩ to 1.5 MΩ	0.081 %
Input Capacitance
	5.0 pF to 50 pF	3.9 % + 0.39 pF	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
Wave Generator – Amplitude Sine, Square, Triangle
50 Ω Load	1.8 mV (pk-pk) to 2.5 V (pk-pk)	2.3 % + 78 µV(pk-pk)	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.
1 MΩ Load	1.8 mV (pk-pk) to 55 V (pk-pk)	2.3 % + 78 µV(pk-pk)
Wave Generator – Frequency Sine, Square, Triangle
	10 Hz to 10 kHz	0.0019 % + 0.012 Hz	Fluke 5520A / SC1100 or equivalent standard. Source. Onsite calibration available.

Time and Frequency

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Frequency
10 MHz	5.9 x 10^-10	Rubidium Oscillator or equivalent standard. Source. For the calibration of frequency measuring devices. Uncertainty values of derivatives of 10 MHz will differ due to resolution, noise, and gating errors.
10 MHz	2.3 x 10^-9	Keysight 53132A or equivalent standard. Measure capability. For the calibration of frequency sources. On-site calibration available. Uncertainty values of derivatives of 10 MHz will differ due to resolution, noise, and gating errors.

Force

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Tension
1 lbf to 400 lbf	0.013 % + 0.6R Where R is the resolution of the device under test	For the calibration of force measuring instruments using NIST Class F Weights
Compression
1 lbf to 400 lbf	0.013 % + 0.6R Where R is the resolution of the device under test	For the calibration of force measuring instruments using NIST Class F Weights
Torque
4 lbf-in to 10 lbf-in	1.9 %	For the calibration of torque tools by comparison to a reference torque transducer. On-site calibration available.
10 lbf-in to 30 lbf-in	1.0 %
30 lbf-in to 80 lbf-ft	0.76 %
80 lbf-ft to 250 lbf-ft	0.60 %
250 lbf-ft to 600 lbf-ft	0.57 %

Mass

Balances

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Specific values
30 kg	82 mg	ASTM Class 1 weights or equal standard. See note ^{Footnote 3}.
25 kg	70 mg
20 kg	55 mg
10 kg	28 mg
5 kg	12.3 mg
2 kg	5.3 mg
1 kg	2.6 mg
500 g	1.9 mg
200 g	0.53 mg
100 g	280 μg
50 g	135 μg
20 g	94 μg
10 g	67 μg
5 g	55 μg
3 g	55 μg
2 g	55 μg
1 g	55 μg
500 mg	44 μg
200 mg	44 μg
100 mg	44 μg
50 mg	44 μg
20 mg	44 μg
10 mg	44 μg
5 mg	44 μg
1 mg	44 μg
Other values
1 lb to 400 lb	0.012 %	NIST Class F weight or equal standard. See note ^{Footnote 3}.

Pressure

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
0 psia to 7.5 psia	0.00075 psia	For the calibration of pressure measuring devices using a reference pressure transducer. Pneumatic: Absolute. On-site calibration available.
7.5 psia to 15 psia	0.01 %
15 psia to 25 psia	0.0019 psia
25 psia to 500 psia	0.0065 % + 0.001 psia
500 psia to 1015 psia	0.01 %
-30 inHg to -2.3 inHg	0.0091 %	For the calibration of pressure measuring devices using a reference pressure transducer. Pneumatic: Gauge. On-site calibration available.
-2.3 inHg to 0 inHg	0.0002 inHg
0 in H₂O to 7 in H₂O	0.0030 in H₂O
7 in H₂O to 40 in H₂O	0.0023 in H₂O
40 in H₂O to 14.5 psig	0.0060 %
14.5 psig to 25 psig	0.0017 psig
25 psig to 500 psig	0.0065 %
500 psig to 1000 psig	0.01 %
10 psig to 50 psig	0.004 psig	For the calibration of pressure measuring devices using a reference pressure transducer. Hydraulic: Gauge. On-site calibration available.
50 psig to 500 psig	0.0079 %
500 psig to 1000 psig	0.08 psig
1000 psig to 10000 psig	0.0082 %

Thermometry

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Digital Thermometers, thermometers, RTD, PRT and Thermistor probes
-80 °C to 0 °C	0.018 °C	Liquid Bath/Dry Block with HART 5628 Black Stack or equivalent standard. Source. For the calibration of temperature measuring equipment. Onsite calibration available.
0.01 °C	0.0033 °C
0 °C to 150 °C	0.033 °C
150 °C C to 300°C	0.042 °C
300 °C to 660 °C	0.067 °C
Dry Blocks, Liquid Baths
195 °C to 0 °C	0.012 °C	HART 5628 Black Stack or equivalent standard. For the calibration of temperature sourcing equipment. Onsite calibration available.
0 °C to 420 °C	0.026 °C
420 °C to 660 °C	0.037 °C
Thermocouples Wires and Probe – Type J, K, E, T
80 °C to 0 °C	0.22 °C	Liquid Bath/Dry Block with HART 5628 Black Stack and Ectron 1140A or equivalent standard. For the calibration of Thermocouple wires and probes. Onsite calibration available.
0 °C to 100 °C	0.22 °C
100 °C to 150 °C	0.26 °C
150 °C to 300 °C	0.41 °C
300 °C to 660 °C	0.71 °C

Humidity

Measured Quantity & Range or Instrument	Calibration Measurement Capability expressed as an Uncertainty (±) (See supplementary notes)	Remarks
Relative Humidity
0 °C to 15 °C 10% to 75 % RH	0.50 % RH	Thunder 2500 or equivalent standard. Source. For the calibration of relative humidity and temperature measuring instruments.
0 °C to 15 °C 75 % to 95 % RH	0.65 % RH
15 °C to 35 °C 10 % to 95 % RH	0.50 % RH
35 °C to 70°C 10 % to 50 % RH	0.50 % RH
35 °C to 70 °C 50 % to 75 % RH	0.70% RH
35 °C to 70 °C 75 % to 95 % RH	0.85% RH
Relative Humidity Controlled Chambers
40°C to -20°C 0 % RH to 100 % RH	1.80 % RH	Vaisala HM70/HMP77 or equivalent standard. Measure. For the calibration of humidity controlled chambers. On-site calibration available.
-20°C to 40°C 0 % RH to 90 % RH	1.26 % RH
-20°C to 40°C 0 % RH to 100 % RH	2.03 % RH
40°C to 180°C 0 % RH to 100 % RH	1.80 % RH

Footnotes

Footnote 1

The uncertainties shown are for the most favorable conditions. There is an increase in uncertainty that corresponds to the laboratory's AC voltage and current uncertainties at different frequencies other than the ones shown. Power factors (PF) other than the one shown contribute to the power uncertainty. PF is related to the cosine of phase. Therefore, uncertainties track the laboratory's phase uncertainty closely at PF near one but are magnified heavily as PF approaches zero. The lab may also report reactive power, apparent power, and power factor under this accreditation. If needed, contact laboratory for more information regarding uncertainties at frequency and power factor combinations other than the ones shown.

Return to footnote 1 referrer

Footnote 2

The stated uncertainty is the laboratory's ability to source a fast rise pulse that is approximately 250 ps. In the typical application of measuring rise time of an oscilloscope, this value is one of the contributing factors, but other factors are derived from the DUT.

Return to footnote 2 referrer

Footnote 3

The Calibration Measurement Capability listed can be achieved only if the balances being calibrated are suitable for such a measurement. The Calibration Measurement Capability is based upon the use of ASTM Class 1 or NIST Class F reference weights. The Calibration Measurement Capability reflects the uncertainty contribution of the weights including co¬variances. It also includes the repeatability and readability of the best balances that the laboratory calibrates routinely in the given measurement ranges. The Calibration Measurement Capabilities for measurements between 500 g and 30 kg are dominated by the performances of the best balances calibrated by the laboratory, rather than by the laboratory's reference standards and measurement processes. The uncertainty stated on the calibration report will include the uncertainty contribution of the balances that were calibrated. All values are expressed in conventional mass, as defined above. On-site calibration available.

Return to footnote 3 referrer